Improvement in Photo-Bias Stability of High-Mobility Indium Zinc Oxide Thin-Film Transistors by Oxygen High-Pressure Annealing

✍ Scribed by Park, Se Yeob; Song, Ji Hun; Lee, Chang-Kyu; Son, Byeong Geun; Lee, Chul-Kyu; Kim, Hyo Jin; Choi, Rino; Choi, Yu Jin; Kim, Un Ki; Hwang, Cheol Seong; Kim, Hyeong Joon; Jeong, Jae Kyeong

• Book ID: 121687141
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 557 KB
• Volume: 34
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2013.2259574