Improvement in the bias stability of tin oxide thin-film transistors by hafnium doping

✍ Scribed by Woong-Sun Kim; Yeon-Keon Moon; Kyung-Taek Kim; Sae-Young Shin; Jong-Wan Park

• Book ID: 113937205
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 691 KB
• Volume: 520
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2011.08.028