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High stability of amorphous hafnium–zinc–tin oxide thin film transistors

✍ Scribed by Kim, Woong-Sun; Shin, Sae-Young; Lee, Sang-Ho; Han, Dong-Suk; Park, Jong-Wan

Book ID: 121462819
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 671 KB
Volume: 12
Category: Article
ISSN: 1567-1739
DOI: 10.1016/j.cap.2012.05.042

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