## Abstract A method is described for the preparation of crossβsectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that
β¦ LIBER β¦
Improved technique for cross-sectional imaging of thin polymer films by transmission electron microscopy
β Scribed by Martin Kunz; Kenneth Shull
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 570 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0032-3861
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