𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Cross-sectional transmission electron microscopy of thin film polycrystalline semiconductors by conventional microtomy

✍ Scribed by Ana Albu-Yaron; Andre Frank; Gary Hodes; Rommel Noufi

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
924 KB
Volume
227
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

A novel technique for the preparation of
A novel technique for the preparation of thin films for cross-sectional transmission electron microscopy
✍ Heuer, J. P. ;Howitt, D. G. πŸ“‚ Article πŸ“… 1990 πŸ› Wiley (John Wiley & Sons) 🌐 English βš– 256 KB πŸ‘ 1 views

## Abstract A method is described for the preparation of cross‐sectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that

The preparation of cross-sectional speci
The preparation of cross-sectional specimens of thin poorly adhered scales for transmission electron microscopy
✍ P. Fox πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 250 KB πŸ‘ 1 views

## INTRODUCTION. The high temperature oxidation of alumina-and chromia-forming metals and alloys has been studied for many years. Although it is fairly easy to produce TEM cross-sections of the adherent scales formed on alloys containing reactive elements it has proved more difficult to cross-sect