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Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors

โœ Scribed by S Haendler; J Jomaah; G Ghibaudo; F Balestra


Book ID
108361820
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
560 KB
Volume
41
Category
Article
ISSN
0026-2714

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