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Measurements of low-frequency noise and surface state concentration in MOS transistors : Artur Owczarek. Electron. Technol.9, (3/4) 43 (1976)

Publisher: Elsevier Science
Year: 1977
Tongue: English
Weight: 139 KB
Volume: 16
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(77)90259-1

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