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Analysis of channel noise and threshold voltage in sos-MOS transistors in the temperature range of 77–300 K

✍ Scribed by A. Touboul; D. Sodini; D. Rigaud; G. Lecoy


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
600 KB
Volume
23
Category
Article
ISSN
0038-1101

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