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Impact of the Ge Content on the Bandgap-Narrowing Induced Leakage Current of Recessed Source/Drain Junctions

โœ Scribed by Gonzalez, M.B.; Simoen, E.; Vissouvanadin, B.; Verheyen, P.; Loo, R.; Claeys, C.


Book ID
114619646
Publisher
IEEE
Year
2009
Tongue
English
Weight
379 KB
Volume
56
Category
Article
ISSN
0018-9383

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