✦ LIBER ✦

Impact of Process Variations on Upset Reversal in a 65 nm Flip-Flop

✍ Scribed by Kauppila, Amy V.; Ball, Dennis R.; Bhuva, Bharat L.; Massengill, Lloyd W.; Holman, W. Tim

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Impact of Process Variations and Charge

✍ Kauppila, A. V.; Bhuva, B. L.; Massengill, L. W.; Holman, W. T.; Ball, D. R. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 921 KB

Analysis of process variations impact on

✍ Wang, TianQi; Xiao, LiYi; Zhou, Bin; Qi, ChunHua 📂 Article 📅 2014 🏛 SP Science China Press 🌐 English ⚖ 919 KB

[IEEE 2012 IEEE International Conference

✍ Khan, Imran Ahmed; Shaikh, Danish; Beg, Mirza Tariq 📂 Article 📅 2012 🏛 IEEE ⚖ 490 KB

The Effect of Layout Topology on Single-

✍ Ahlbin, J. R.; Gadlage, M. J.; Ball, D. R.; Witulski, A. W.; Bhuva, B. L.; Reed, 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 657 KB

[IEEE 2007 IEEE International Symposium

✍ Hansson, Martin; Alvandpour, Atila 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 692 KB

[IEEE 2010 IEEE Symposium on VLSI Circui

✍ Furuta, Jun; Ham, Chikara; Kobayashi, Kazutoshi; Onodera, Hidetoshi 📂 Article 📅 2010 🏛 IEEE ⚖ 392 KB