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Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

โœ Scribed by Kauppila, A. V.; Bhuva, B. L.; Massengill, L. W.; Holman, W. T.; Ball, D. R.


Book ID
119950477
Publisher
IEEE
Year
2011
Tongue
English
Weight
921 KB
Volume
58
Category
Article
ISSN
0018-9499

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