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Analysis of process variations impact on the single-event transient quenching in 65 nm CMOS combinational circuits

โœ Scribed by Wang, TianQi; Xiao, LiYi; Zhou, Bin; Qi, ChunHua


Book ID
121551766
Publisher
SP Science China Press
Year
2014
Tongue
English
Weight
919 KB
Volume
57
Category
Article
ISSN
1006-9321

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