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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Efficient single event upset simulations of a tolerant PD SOI CMOS D Flip-Flop

✍ Scribed by Alvarado, J.; Kilchytska, V.; Berger, G.; Flandre, D.

Book ID: 117998849
Publisher: IEEE
Year: 2009
Weight: 289 KB
Volume: 0
Category: Article
ISBN: 1457704927
DOI: 10.1109/radecs.2009.5994584

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