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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Enabling mixed-mode analysis of nano-scale SiGe BiCMOS technologies in extreme environments

โœ Scribed by Turowski, Marek; Raman, Ashok; Fedoseyev, Alex


Book ID
118060479
Publisher
IEEE
Year
2009
Weight
317 KB
Volume
0
Category
Article
ISBN
1457704927

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