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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - SEU data and fault tolerance analysis of a LEON 3FT processor

✍ Scribed by Jordan, A.; Hafer, C.; Mabra, J.; Griffith, S.; Nagy, J.; Lahey, M.; Harris, D.

Book ID: 118254029
Publisher: IEEE
Year: 2009
Weight: 265 KB
Volume: 0
Category: Article
ISBN: 1457704927
DOI: 10.1109/radecs.2009.5994733

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