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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - A compact model for Single Event Effects in PD SOI sub-micron MOSFETs

✍ Scribed by Alvarado, J.; Kilchytska, V.; Boufouss, E.; Flandre, D.

Book ID: 118158262
Publisher: IEEE
Year: 2011
Weight: 581 KB
Volume: 0
Category: Article
ISBN: 1457705850
DOI: 10.1109/radecs.2011.6131345

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