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[IEEE 2010 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2010.06.16-2010.06.18)] 2010 Symposium on VLSI Circuits - A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element

✍ Scribed by Furuta, Jun; Ham, Chikara; Kobayashi, Kazutoshi; Onodera, Hidetoshi

No coin nor oath required. For personal study only.

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