Impact of Off-State Stress and Negative Bias Temperature Instability on Degradation of Nanoscale pMOSFET

✍ Scribed by Nam-Hyun Lee; Hyungwook Kim; Bongkoo Kang

• Book ID: 119799642
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 149 KB
• Volume: 33
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2011.2174026