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Effect of off-State Stress and Drain Relaxation Voltage on Degradation of a Nanoscale nMOSFET at High Temperature

✍ Scribed by N. Lee; D. Baek; B. Kang


Book ID
126769450
Publisher
IEEE
Year
2011
Tongue
English
Weight
135 KB
Volume
32
Category
Article
ISSN
0741-3106

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