✦ LIBER ✦
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs
✍ Scribed by Lee, Seonhaeng; Kim, Cheolgyu; Kim, Hyeokjin; Kim, Gang-Jun; Seo, Ji-Hoon; Son, Donghee; Kang, Bongkoo
- Book ID
- 123465503
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 770 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.