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Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverter

✍ Scribed by N. Berbel; R. Fernandez; I. Gil

Book ID: 108210819
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 527 KB
Volume: 49
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2009.06.027

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