๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Imaging of high-Tc superconducting film spatial inhomogeneities by low-temperature scanning electron microscopy

โœ Scribed by V.E. Umansky; S.A. Solov'ev; S.G. Konnikov; S.F. Karmanenko; O.V. Kosogov

Book ID
119124442
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
370 KB
Volume
9
Category
Article
ISSN
0167-577X

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Low-temperature scanning electron micros
Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions
โœ R. Gross; T. Doderer; R.P. Huebener; F. Kober; D. Koelle; C. Kruelle; J. Mannhar ๐Ÿ“‚ Article ๐Ÿ“… 1991 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 632 KB

The invited talk was given by R. Gross. Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial a

Imaging of electrical inhomogeneities in
Imaging of electrical inhomogeneities in YBa2Cu3O7โˆ’x thin-film structures by room-temperature laser scanning microscopy
โœ Yu.Ya. Divin; P.M. Shadrin ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 670 KB

Imaging of local electrical inhomogeneities in YBa2Cu307\_ x thin films and grain-boundary junctions was demonstrated at room temperature. The spatial distributions of the voltage response of the samples to the focused laser beam were measured with and without bias current through the samples. High-