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Spatial resolution limit for the investigation of high-Tc films by low temperature scanning electron microscopy

✍ Scribed by Gross, R.; Hartmann, M.; Hipler, K.; Huebener, R.P.; Kober, F.; Koelle, D.

Book ID: 114550122
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 375 KB
Volume: 25
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.92756

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