Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions

✍ Scribed by R. Gross; T. Doderer; R.P. Huebener; F. Kober; D. Koelle; C. Kruelle; J. Mannhart; B. Mayer; D. Quenter; A. Ustinov

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 632 KB
• Volume: 169
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(91)90261-c

✦ Synopsis

The invited talk was given by R. Gross. Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial and temporal resolution is obtained. By Low-Temperature Scanning Electron Microscopy (LTSEM) important new information on low-temperature phenomena in superconductors, semiconductors, and insulators is obtained by two-dimensional imaging. Here, we summarize the basic principles of LTSEM and show its application to the study of superconducting films and Josephson junctions.