The invited talk was given by R. Gross. Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial a
β¦ LIBER β¦
Low-temperature scanning electron microscopy of superconducting microbridges
β Scribed by R. Eichele; R.P. Huebener; H. Pavlicek; H. Seifert
- Publisher
- Elsevier Science
- Year
- 1981
- Weight
- 141 KB
- Volume
- 108
- Category
- Article
- ISSN
- 0378-4363
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