Examination of superconducting micro-circuits by low-temperature-scanning-electron-microscopy
β Scribed by Pavlicek, H.; Freytag, L.; Huebener, R.; Seifert, H.
- Book ID
- 114646352
- Publisher
- IEEE
- Year
- 1983
- Tongue
- English
- Weight
- 387 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0018-9464
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π SIMILAR VOLUMES
The invited talk was given by R. Gross. Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial a
## Abstract By lowβtemperature transmission electron microscopy we have found nanodomains in a polycrystalline Nb~3~Sn sample. We interpret that these nanodomains form due to a tetragonal distortion. Because twinning seems to be a prominent feature of the real structure of many high __T__~c~ superc