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Low-temperature scanning electron microscopy for studying inhomogeneities in thin-film high-Tcsuperconductors

✍ Scribed by R. P. Huebener; R. Gross; J. Bosch

Book ID
112514004
Publisher
Springer
Year
1988
Tongue
English
Weight
586 KB
Volume
70
Category
Article
ISSN
1434-6036

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