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[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - A characterization tool for current degradation effects of abnormally structured MOS transistors

✍ Scribed by Jin-Kyu Park, ; Chang-Hoon Choi, ; Young-Kwan Park, ; Chang-Sub Lee, ; Jeong-Taek Kong, ; Moon-Ho Kim, ; Kyung-Ho Kim, ; Taek-Soo Kim, ; Sang-Hoon Lee,

Book ID: 126710210
Publisher: IEEE
Year: 1997
Weight: 418 KB
Category: Article
ISBN-13: 9780780337756
DOI: 10.1109/SISPAD.1997.621331

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📜 SIMILAR VOLUMES

[IEEE SISPAD '97. 1997 International Con

[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Two-dimensional device simulator for cyclic bias application

✍ Ohno, Y.; Takahashi, Y. 📂 Article 📅 1997 🏛 IEEE ⚖ 349 KB

[IEEE SISPAD '97. 1997 International Con

[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Gridding techniques for the level set method in semiconductor process and device simulation

✍ Kan, E.C.; Ze-Kai Hsiau, ; Rao, V.; Dutton, R.W. 📂 Article 📅 1997 🏛 IEEE ⚖ 602 KB

[IEEE SISPAD '97. 1997 International Con

[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Photoresist process optimization for defects using a rigorous lithography simulator

✍ Milor, L.; Orth, L.; Steele, D.; Khoi Phan, ; Xiaolei Li, ; Strojwas, A.; Yung-T 📂 Article 📅 1997 🏛 IEEE ⚖ 425 KB

[IEEE SISPAD '97. 1997 International Con

[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Application of TCAD to designing advanced DRAM and logic devices

✍ Fukuda, I.; Nishi, K. 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 394 KB

[IEEE SISPAD '97. 1997 International Con

[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Density-gradient simulations of quantum effects in ultra-thin-oxide MOS structures

✍ Ancona, M.G.; Yu, Z.; Lee, W.-C.; Dutton, R.W.; Voorde, P.V. 📂 Article 📅 1997 🏛 IEEE ⚖ 353 KB

[IEEE SISPAD '97. 1997 International Con

[IEEE SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Cambridge, MA, USA (8-10 Sept. 1997)] SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest - Solution of 1-D Schrodinger and Poisson equations double gate SOI MOS

✍ Fiegna, C.; Abramo, A. 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 342 KB