𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Vertical tunnel field-effect transistor with bandgap modulation and workfunction engineering

✍ Scribed by Bhuwalka, K.K.; Schulze, J.; Eisele, I.

Book ID: 126738348
Publisher: IEEE
Year: 2004
Weight: 230 KB
Category: Article
ISBN-13: 9780780384781
DOI: 10.1109/ESSDER.2004.1356534

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Perspective of FinFETs for analog applications

✍ Kilchytska, V.; Collaert, N.; Rooyackers, R.; Lederer, D.; Raskin, J.-P.; Flandr 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 286 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - A comprehensive study of corner effects in tri-gate transistors

✍ Stadele, M.; Luyken, R.J.; Roosz, M.; Specht, M.; Rosner, W.; Dreeskornfeld, L.; 📂 Article 📅 2004 🏛 IEEE ⚖ 298 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - New methodologies of NBTI characterization eliminating recovery effects

✍ Denais, M.; Huard, V.; Parthasarathy, C.; Ribes, G.; Perrier, F.; Revil, N.; Bra 📂 Article 📅 2004 🏛 IEEE ⚖ 278 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - FinFET SRAM for high-performance low-power applications

✍ Joshi, R.V.; Williams, R.Q.; Nowak, E.; Kim, K.; Beintner, J.; Ludwig, T.; Aller 📂 Article 📅 2004 🏛 IEEE ⚖ 297 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Interface passivation mechanisms in metal gated oxide capacitors

✍ Lujan, G.S.; Schram, T.; Sjoblom, G.; Witters, T.; Kubicek, S.; De Gendt, S.; He 📂 Article 📅 2004 🏛 IEEE ⚖ 235 KB

[IEEE Proceedings of the 34th European S

[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Gate-capacitance extraction from RF C-V measurements [MOS device applications]

✍ Sasse, G.T.; de Kort, R.; Schmitz, J. 📂 Article 📅 2004 🏛 IEEE ⚖ 273 KB