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[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - New methodologies of NBTI characterization eliminating recovery effects

✍ Scribed by Denais, M.; Huard, V.; Parthasarathy, C.; Ribes, G.; Perrier, F.; Revil, N.; Bravaix, A.

Book ID: 126608035
Publisher: IEEE
Year: 2004
Weight: 278 KB
Category: Article
ISBN-13: 9780780384781
DOI: 10.1109/ESSDER.2004.1356540

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