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[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Interface passivation mechanisms in metal gated oxide capacitors

✍ Scribed by Lujan, G.S.; Schram, T.; Sjoblom, G.; Witters, T.; Kubicek, S.; De Gendt, S.; Heyns, M.; De Meyer, K.

Book ID: 126605005
Publisher: IEEE
Year: 2004
Weight: 235 KB
Category: Article
ISBN-13: 9780780384781
DOI: 10.1109/ESSDER.2004.1356555

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