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[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Gate-capacitance extraction from RF C-V measurements [MOS device applications]

✍ Scribed by Sasse, G.T.; de Kort, R.; Schmitz, J.

Book ID: 120019345
Publisher: IEEE
Year: 2004
Weight: 273 KB
Category: Article
ISBN-13: 9780780384781
DOI: 10.1109/ESSDER.2004.1356501

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