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[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - A comprehensive study of corner effects in tri-gate transistors

✍ Scribed by Stadele, M.; Luyken, R.J.; Roosz, M.; Specht, M.; Rosner, W.; Dreeskornfeld, L.; Hartwich, J.; Hofmann, F.; Kretz, J.; Landgraf, E.; Risch, L.

Book ID: 120026533
Publisher: IEEE
Year: 2004
Weight: 298 KB
Category: Article
ISBN-13: 9780780384781
DOI: 10.1109/ESSDER.2004.1356515

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