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[IEEE Proceedings of the 34th European Solid-State Device Research Conference - Leuven, Belgium (21-23 Sept. 2004)] Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) - Experimental comparison between double gate, ground plane, and single gate SOI CMOSFETs

✍ Scribed by Lolivier, J.; Widiez, J.; Vinet, A.; Poiroux, T.; Dauge, F.; Previtali, B.; Mouis, A.; Jommah, J.; Balestra, F.; Deleonibus, S.

Book ID: 121819093
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 231 KB
Category: Article
ISBN-13: 9780780384781
DOI: 10.1109/ESSDER.2004.1356492

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