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[IEEE Proceedings of 1994 IEEE International Reliability Physics Symposium - San Jose, CA, USA (1994.04.11-1994.04.14)] Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 - Field and temperature acceleration of time-dependent dielectric breakdown in intrinsic thin SiO/sub 2/

✍ Scribed by Suehle, J.S.; Chaparala, P.; Messick, C.; Miller, W.M.; Boyko, K.C.

Book ID: 124062067
Publisher: IEEE
Year: 1994
Weight: 473 KB
Edition: 32
Category: Article
ISBN-13: 9780780313576
DOI: 10.1109/RELPHY.1994.307847

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