𝔖 Bobbio Scriptorium

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[IEEE Proceedings of 1994 IEEE International Reliability Physics Symposium - San Jose, CA, USA (1994.04.11-1994.04.14)] Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 - dv/dt induced latching failure in 1200 V/400 A halfbridge IGBT modules

✍ Scribed by Wuchen Wu, ; Held, M.; Umbricht, N.; Birolini, A.

Book ID: 115482831
Publisher: IEEE
Year: 1994
Weight: 504 KB
Edition: 32
Volume: 0
Category: Article
ISBN-13: 9780780313576
DOI: 10.1109/relphy.1994.307804

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