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[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Comparison of product failure rate to the component soft error rates in a multi-core digital signal processor

✍ Scribed by Xiaowei Zhu, ; Baumann, R.; Pilch, C.; Zhou, J.; Jones, J.; Cirba, C.

Book ID: 126767543
Publisher: IEEE
Year: 2005
Weight: 996 KB
Category: Article
ISBN-13: 9780780388031
DOI: 10.1109/RELPHY.2005.1493086

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