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[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Polarity dependence of dielectric breakdown in scaled SiO/sub 2/

✍ Scribed by Han, L.K.; Bhat, M.; Wristers, D.; Fulford, J.; Kwong, D.L.

Book ID: 127020642
Publisher: IEEE
Year: 1994
Weight: 373 KB
Category: Article
ISBN-13: 9780780321113
DOI: 10.1109/iedm.1994.383334

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