𝔖 Bobbio Scriptorium

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[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Strain dependence of the performance enhancement in strained-Si n-MOSFETs

✍ Scribed by Welser, J.; Hoyt, J.L.; Takagi, S.; Gibbons, J.F.

Book ID: 120635887
Publisher: IEEE
Year: 1994
Weight: 347 KB
Category: Article
ISBN-13: 9780780321113
DOI: 10.1109/IEDM.1994.383389

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