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[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - The implications of self-consistent current density design guidelines comprehending electromigration and Joule heating for interconnect technology evolution

✍ Scribed by Hunter, W.R.

Book ID: 118147244
Publisher: IEEE
Year: 1995
Weight: 400 KB
Volume: 0
Category: Article
ISBN-13: 9780780327009
DOI: 10.1109/iedm.1995.499243

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