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[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - SiGe HBT technology: device and application issues

✍ Scribed by Harame, D.; Larson, L.; Case, M.; Kovacic, S.; Voinigescu, S.; Tewksbury, T.; Nguyen-Ngoc, D.; Stein, K.; Cressler, J.; Jeng, S.-J.; Malinowski, J.; Groves, R.; Eld, E.; Sunderland, D.; Rensch, D.; Gilbert, M.; Schonenberg, K.; Ahlgren, D.; Rosenbaum, S.; Glenn, J.; Meyerson, B.

Book ID: 120707684
Publisher: IEEE
Year: 1995
Weight: 356 KB
Category: Article
ISBN-13: 9780780327009
DOI: 10.1109/IEDM.1995.499322

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