✦ LIBER ✦

[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - Device drive current degradation observed with retrograde channel profiles

✍ Scribed by Venkatesan, S.; Lutze, J.W.; Lage, C.; Taylor, W.J.

No coin nor oath required. For personal study only.

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