✦ LIBER ✦

[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides

✍ Scribed by Degraeve, R.; Groeseneken, G.; Bellens, R.; Depas, M.; Maes, H.E.

No coin nor oath required. For personal study only.

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