𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Single-electron pass-transistor logic: operation of its elemental circuit

✍ Scribed by Ono, Y.; Takahashi, Y.

Book ID: 120759189
Publisher: IEEE
Year: 2000
Weight: 362 KB
Edition: 2000
Category: Article
ISBN-13: 9780780364387
DOI: 10.1109/IEDM.2000.904315

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE International Electron Devices Mee

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - The ballistic nanotransistor: a simulation study

✍ Zhibin Ren, ; Venugopal, R.; Datta, S.; Lundstrom, M.; Jovanovic, D.; Fossum, J. 📂 Article 📅 2000 🏛 IEEE ⚖ 402 KB

[IEEE International Electron Devices Mee

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Characteristics of AlGaN/GaN HEMT devices with SiN passivation

✍ Jong-Soo Lee, ; Vescan, A.; Wieszt, A.; Dietrich, R.; Leier, H.; Young-Se Kwon, 📂 Article 📅 2000 🏛 IEEE ⚖ 297 KB

[IEEE International Electron Devices Mee

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - High-Q VHF micromechanical contour-mode disk resonators

✍ Clark, J.R.; Wan-Thai Hsu, ; Nguyen, C.T.-C. 📂 Article 📅 2000 🏛 IEEE ⚖ 668 KB

[IEEE International Electron Devices Mee

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Boron diffusion and activation in the presence of other species

✍ Hong-Jyh Li, ; Kohli, P.; Ganguly, S.; Kirichenko, T.A.; Zeitzoff, P.; Torres, K 📂 Article 📅 2000 🏛 IEEE ⚖ 418 KB

[IEEE International Electron Devices Mee

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - V/sub th/ fluctuation induced by statistical variation of pocket dopant profile

✍ Tanaka, T.; Usuki, T.; Futatsugi, T.; Momiyama, Y.; Sugii, T. 📂 Article 📅 2000 🏛 IEEE ⚖ 355 KB

[IEEE International Electron Devices Mee

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - A high-Q tunable micromechanical capacitor with movable dielectric for RF applications

✍ Jun-Bo Yoon, ; Nguyen, C.T.-C. 📂 Article 📅 2000 🏛 IEEE ⚖ 503 KB