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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - V/sub th/ fluctuation induced by statistical variation of pocket dopant profile

โœ Scribed by Tanaka, T.; Usuki, T.; Futatsugi, T.; Momiyama, Y.; Sugii, T.


Book ID
115531320
Publisher
IEEE
Year
2000
Weight
355 KB
Edition
2000
Volume
0
Category
Article
ISBN-13
9780780364387

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