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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - The ballistic nanotransistor: a simulation study

✍ Scribed by Zhibin Ren, ; Venugopal, R.; Datta, S.; Lundstrom, M.; Jovanovic, D.; Fossum, J.

Book ID: 120640579
Publisher: IEEE
Year: 2000
Weight: 402 KB
Edition: 2000
Category: Article
ISBN-13: 9780780364387
DOI: 10.1109/IEDM.2000.904418

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