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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - A new analytical delay and noise model for on-chip RLC interconnect

✍ Scribed by Yu Cao, ; Xuejue Huang, ; Sylvester, D.; Chang, N.; Chenming Hu,

Book ID: 115478457
Publisher: IEEE
Year: 2000
Weight: 302 KB
Edition: 2000
Volume: 0
Category: Article
ISBN-13: 9780780364387
DOI: 10.1109/iedm.2000.904444

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