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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Test structure to measure the gate-drain coupling capacitor using accelerated techniques

✍ Scribed by Manku, T.

Book ID: 126678265
Publisher: IEEE
Year: 1996
Weight: 197 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535621

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