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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Observation of light emissions from hot electrons and latch-up at the cleaved surface of CMOS structures

✍ Scribed by Aoki, T.

Book ID: 126618742
Publisher: IEEE
Year: 1996
Weight: 362 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535660

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