𝔖 Bobbio Scriptorium

✦ LIBER ✦

IEEE International conference on microelectronic Test structures: San Diego, California March 5–7, 1990

Book ID: 107829230
Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 89 KB
Volume: 20
Category: Article
ISSN: 0026-2692
DOI: 10.1016/0026-2692(89)90035-9

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - San Diego, CA, USA (1990.03.5-1990.03.7)] International Conference on Microelectronic Test Structures - Enhanced SPICE MOSFET model for analog applications including parameter extraction schemes

✍ Power, J.A.; Lane, W.A. 📂 Article 📅 1990 🏛 IEEE ⚖ 466 KB

[IEEE 1994 IEEE International Conference

[IEEE 1994 IEEE International Conference on Microelectronic Test Structures - San Diego, CA, USA (22-25 March 1994)] Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures - Design of matching test structures [IC components]

✍ Tuinhout, H.P. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 650 KB

[IEEE 2012 IEEE International Conference

[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - A diaphragm based piezoelectric AlN film quality test structure

✍ Jackson, Nathan; O'Keeffe, Rosemary; O'Leary, Robert; O'Neill, Mike; Waldron, Fi 📂 Article 📅 2012 🏛 IEEE ⚖ 795 KB

[IEEE ICMTS 92 1992 International Confer

[IEEE ICMTS 92 1992 International Conference on Microelectronic Test Structures - San Diego, CA, USA (16-19 March 1992)] ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures - Yield test structures and their use for process development

✍ Magdo, S. 📂 Article 📅 1992 🏛 IEEE ⚖ 513 KB

[IEEE 2012 IEEE International Conference

[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - An extended de-embedding method for on-wafer components

✍ Yu-Ling Lin, ; Hsiao-Tsung Yen, ; Ho-Hsiang Chen, ; Chewn-Pu Jou, ; Chin-Wei Kuo 📂 Article 📅 2012 🏛 IEEE ⚖ 957 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Mismatch characterization of small size MOS transistors

✍ Bastos, J.; Steyaert, M.; Roovers, R.; Kinget, P.; Sansen, W.; Graindourze, B.; 📂 Article 📅 1995 🏛 IEEE ⚖ 677 KB